Chroma ATE Inc.

VLSI Test System

Semiconductor/IC Test Solution

VLSI Test System

Chroma provides a wide portfolio of semiconductor IC test solutions ranging from ATE(SoC Test Systems,VLSI Test Systems) , PXI systems, IC handlers, and system level test solutions.

On the ATE & PXI side, the solutions cover applications in consumer SoC (MCU, controller, audio, peripheral), power management IC (Regulator, LDO, DC/DC, AC/DC, LED Driver), RF (FEM, Connectivity, Mobile) and other specific applications (CIS, Light Sensors, RFID).

On the handler & automatic system side, the solutions include thermal control, extreme device handling technologies, bare die handling, pick and place handlers, CIS turnkey solutions, and system level test solutions.

With the turnkey solutions, Chroma provides a best approach for customers to bring down the cost of test while maintaining the test quality and performance.

Overview: Semiconductor/IC Test Solution

Brochure: Semiconductor/IC Test Solutions (PDF/2.2MB)

VLSI Test System